Radiation
testing
Space Radiation environment impact significantly the performances of electronic devices. Cumulative effects such as Total Ionizing Dose (TID) and Total Non-Ionizing Dose (TNID) induce electrical parameters to drift out of their expected ranges (as defined in datasheets). Additional exposure to radiation may lead to parts loss of functionality.
TID and TNID behaviour of electronic devices shall be evaluated to assess long term reliability requirements.
Irradiation in particules accelerator
Irradiation in particules accelerator
- In air or in vacuum
- Heavy ions
- Protons
- Neutrons
- Alpha particles (*)
- Electrons
- Muons
(*) Performed in Alter France
TID/TNID Test
Space Radiation environment impact significantly the performances of electronic devices. Cumulative effects such as Total Ionizing Dose (TID) and Total Non-Ionizing Dose (TNID) induce electrical parameters to drift out of their expected ranges (as defined in datasheets). Additional exposure to radiation may lead to parts loss of functionality.
TID and TNID behaviour of electronic devices shall be evaluated to assess long term reliability requirements.
TID/TNID Test set-up
- Analysis of customer requirements and needs and technical support
- Application of standard TID/TNID test procedures (e.g. ESCC 22900, MIL-STD-883 Test Method 1019, …)
- Test plan redaction
TID/TNID Testbench
Generic solution developed to evaluate Discrete, Integrated Circuit (Digital, Mixed Signal and Analog), Memory (Flash, SDRAM, SRAM, MRAM, FRAM and DDR), ASIC, FPGA, GAL, PLD and SIP/module
- Design and development of on-purposed daughter boards
- Digital Hi-End, Digital Hi pin count, mixed signal, RF and Power
- Parametric & functional tests as well as RF (from S-band to Ka-band), Power up to 3.6 kV and 200A
TID/TNID Test facilities
- Cobalt-60 ⮕ RADLAB irradiator (Alter Spain, Spain); GAMRAY irradiator (TRAD, France), Calliope irradiator (ENEA, Italy), CEA facilities (Saclay France), ….
- Dose rate from few tens rad(Si) per hour to few krad(Si) per hour
- Protons ⮕ Université Catholique de Louvain la Neuve (Belgium) [10-75 MeV protons] ; Paul Scherrer Institute (Switzerland) [6-300 MeV protons]
- 1 MeV neutrons Belgian Nuclear Research Centre (MOL Belgium)
TID / TNID Test report
- Statistical data analysis and radiation induced drifts calculation
SEE Testing
Turnkey SEE Testing Solution
Collaboration and assistance to work out the most appropriate and optimized test solution.
- Analysis of customer requirements and needs
- Expertise to ensure test results meets end user requirements
- Application of standard SEE test procedure (e.g. ESCC 25100)
- Test plan redaction
- Strategy to reduce beam time
SEE Testbench
Generic solutions
- 24 channels power supply delatcher
- Digital tester with 271 I/O
- Multi-channel analog to digital sampler 12 bits 400MSPS for analog SET characterization
- 16 channels single digital signals sampler at 8 GbPS for digital SET characterization
- Power devices test setup for SEB & SEGR characterization
- SDRAM DDR3 and DDR4 tester
Specific solutions
- Evaluation/application board modification
- Specific designs software & hardware
Test report
- Data analysis
- SEFI Identification
- SEL, HCE (High Current Event), SEU, SET, … characterization
- Weibull fit
- Orbit error rate calculation
- Dose rate from few tens rad(Si) per hour to few krad(Si) per hour
- Protons ⮕ Université Catholique de Louvain la Neuve (Belgium) [10-75 MeV protons] ; Paul Scherrer Institute (Switzerland) [6-300 MeV protons]
- 1 MeV neutrons Belgian Nuclear Research Centre (MOL Belgium)
